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Yung-Chia Chang, Chuan-Yung Chen and Kuei-Hu Chang, 2013. Self-assessment of an 5S Audit in Semiconductor Manufacturing. Information Technology Journal, 12: 251-263.
DOI: 10.3923/itj.2013.251.263
URL: https://scialert.net/abstract/?doi=itj.2013.251.263
DOI: 10.3923/itj.2013.251.263
URL: https://scialert.net/abstract/?doi=itj.2013.251.263