Citation to this article as recorded by
Analysis of Threshold Voltage Variance in 45nm N-Channel
Device Using L<sub>27</sub> Orthogonal Array
Method Advanced Materials Research |
How to cite this article
A.R. Ismail, M.H. M. Haniff, B.M. Deros, M.R.A. Rani, Z.K.M. Makhbul and N.K. Makhtar, 2010. The Optimization of Environmental Factors at Manual Assembly Worstation by Using Taguchi Method. Journal of Applied Sciences, 10: 1293-1299.
DOI: 10.3923/jas.2010.1293.1299
URL: https://scialert.net/abstract/?doi=jas.2010.1293.1299
DOI: 10.3923/jas.2010.1293.1299
URL: https://scialert.net/abstract/?doi=jas.2010.1293.1299