Wei Lin
College of Physics and Information Engineering of Fuzhou University, Fuzhou, Fujian, China
Shi-Zhen Huang
Fujian Key Laboratory of Microelectronics and Integrated Circuits
Wen-Long Shi
Fujian Key Laboratory of Microelectronics and Integrated Circuits
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How to cite this article
Wei Lin, Shi-Zhen Huang and Wen-Long Shi, 2013. A Case Study on the Scan Architecture of DFT Technique. Information Technology Journal, 12: 6933-6939.
DOI: 10.3923/itj.2013.6933.6939
URL: https://scialert.net/abstract/?doi=itj.2013.6933.6939
DOI: 10.3923/itj.2013.6933.6939
URL: https://scialert.net/abstract/?doi=itj.2013.6933.6939