Shen-Li Chen
Department of Electronic Engineering, National United University, MiaoLi City 36003, Taiwan
Min-Hua Lee
Department of Electronic Engineering, National United University, MiaoLi City 36003, Taiwan
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How to cite this article
Shen-Li Chen and Min-Hua Lee, 2013. Reliability Influences of Substrate Pick-up and Well Engineering of LV Nmosts
in Communication Modules. Information Technology Journal, 12: 7331-7335.
DOI: 10.3923/itj.2013.7331.7335
URL: https://scialert.net/abstract/?doi=itj.2013.7331.7335
DOI: 10.3923/itj.2013.7331.7335
URL: https://scialert.net/abstract/?doi=itj.2013.7331.7335