Information Technology Journal1812-56381812-5646Asian Network for Scientific Information10.3923/itj.2012.560.562YapingYin YanlinWang GuiliLiu DongLi 42012114In the process of product defects detection, Hough algorithm is widely used in the image angles examines. Not only while operating it needs very big memory space, the speed and the efficiency is slowly. On this foundation an improved Hough algorithm is quoted in the image examines of Crystal chip. It can reduce calculation capacity and shorten the operation time, so, it meets the time of Crystal chips in the industry test.]]>Chutatape, O. and L. Guo,199932181192Qiu, L.W., Z.S. Song and W.Q. Shen,20038741744